VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon)
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author cheng wen wu author laung terng wang author xiaoqing wen format hardback language english publication year 14 08 2006 series systems on silicon subject engineering technology subject 2 energy technology electrical engineering vlsi test principles and architectures by laung terng wang cheng wen wu xiaoqing wen published by morgan kaufmann elsevier science not quite what you re looking for see more books in other free uk delivery on everything not even the right subject see books in arts de
VLSI Test Principles And Architectures Design for Testability, ISBN-13: 9780123705976, ISBN-10: 0123705975
author cheng wen wu author laung terng wang author xiaoqing wen format hardback language english publication year 14 08 2006 series systems on silicon subject engineering technology subject 2 energy technology electrical engineering title vlsi test principles and architectures design for testability author wang laung terng editor wu cheng wen editor wen xiaoqing editor publisher morgan kaufmann pub publication date jul 30 2006 pages 777 binding hardcover edition 1 st dimensions 7 50 wx 9 25 hx
Store Search search Title, ISBN and Author VLSI Test Principles and Architectures: Design for Testability by Laung-Terng Wang, Cheng-Wen Wu Estimated delivery 4-14 business days Format Hardcover Condition Brand New This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability.C
VLSI Test Principles and Architectures Textbook
