Advanced Computing in Electron Microscopy
This book provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. Get and download textbook Advanced Computing in Electron Microscopy for free
Advanced Computing in Electron Microscopy, ISBN-13: 9781441965325, ISBN-10: 1441965327
At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help interpret and understand high resolution information in recorded electron micrographs. This revised edition contains new sections on recent instrumental developments and updated references. It should be useful for beginning and experienced users at the advanced undergraduate or graduate level. This new edition will be a revision of the existing text, including new developments in this field since the original manuscript and updated references.A Advanced Computing in Electron Microscopy new edition
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This review of numerical computation methods in high resolution conventional and scanning transmission electron microscope images shows how image calculations help separate information from artifact. Updated with instrumental developments and new references.
author earl j kirkland format hardback language english publication year 02 09 2010 subject engineering technology subject 2 electronics engineering communications engineering title advanced computing in electron microscopy author kirkland earl j publisher springer verlag publication date sep 01 2010 pages 289 binding hardcover edition 2 nd dimensions 6 50 wx 9 75 hx 1 00 d isbn 1441965327 subject technology engineering material science brand new hardcover all orders get full access to our onl
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Advanced Computing in Electron Microscopy Textbook
At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help interpret and understand high resolution information in recorded electron micrographs. This revised edition contains new sections on recent instrumental developments and updated references. It should be useful for beginning and experienced users at the advanced undergraduate or graduate level
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